SPECTROSCOPIC STUDY OF A DISCHARGE-PUMPED XEF LASER AT HIGH-RESOLUTION

被引：10

作者：

SHIMAUCHI, M

KARASAWA, S

MIURA, T

机构：

[1] MEIJI UNIV,FAC ENGN,KAWASAKI 214,JAPAN

[2] TSUKUBA UNIV,INST PHYS,NIIHARI,IBARAKI 30031,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1978年 / 17卷 / 03期

关键词：

D O I：

10.1143/JJAP.17.527

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：527 / 533

页数：7

共 6 条

[1] HIGH-POWER XENON FLUORIDE LASER [J].

AULT, ER ;

BRADFORD, RS ;

BHAUMIK, ML .

APPLIED PHYSICS LETTERS, 1975, 27 (07) :413-415

[2] 354-NM LASER ACTION ON XEF [J].

BRAU, CA ;

EWING, JJ .

APPLIED PHYSICS LETTERS, 1975, 27 (08) :435-437

[3] XENON FLUORIDE LASER EXCITATION BY TRANSVERSE ELECTRIC-DISCHARGE [J].

BURNHAM, R ;

HARRIS, NW ;

DJEU, N .

APPLIED PHYSICS LETTERS, 1976, 28 (02) :86-87

[4]

CROSSWHITE HM, 1958, 13 J HOPK SPECTR REP

[5] ANALYSIS OF SPONTANEOUS AND LASER-EMISSION FROM XEF [J].

TELLINGHUISEN, J ;

TISONE, GC ;

HOFFMAN, JM ;

HAYS, AK .

JOURNAL OF CHEMICAL PHYSICS, 1976, 64 (11) :4796-4797

[6] FAST-DISCHARGE-INITIATED XEF LASER [J].

WANG, CP ;

MIRELS, H ;

SUTTON, DG ;

SUCHARD, SN .

APPLIED PHYSICS LETTERS, 1976, 28 (06) :326-328

← 1 →