MICROWAVE PHOTOCONDUCTIVITY SCANNING MICROSCOPE STUDIES OF SILICON SURFACES

[1] CONTACTLESS SCANNER FOR PHOTOACTIVE MATERIALS USING LASER-INDUCED MICROWAVE-ABSORPTION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 197 - 201

[2] BOGENSCHUTZ AF, 1967, ATZPRAXIS HALBLEITER, P190

[3] CHEMINSKY G, 1984, P MRS EUROPE STRASBO

[4] AUTOMATIC LASER SCANNER FOR SOLAR-CELLS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (10) : 1580 - 1584

[5] KITTEL C, 1983, EINFUHRUNG FESTKORPE, P469

[6] THE STUDY OF CHARGE CARRIER KINETICS IN SEMICONDUCTORS BY MICROWAVE CONDUCTIVITY MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (10) : 3558 - 3566

[7] LEAMY HJ, 1982, J APPL PHYS, V53, pR57

[8] MICROWAVE PHOTOELECTROCHEMISTRY OF N-WSE2 [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (10) : 2212 - 2213

[9] SILICON-HYDROGEN INTERACTION SEEN BY MICROWAVE-PHOTOELECTROCHEMICAL TECHNIQUES [J]. CHEMICAL PHYSICS LETTERS, 1987, 142 (06) : 546 - 550

[10] MINORITY-CARRIER LIFETIME MAPPING IN SILICON USING A MICROPROCESSOR-CONTROLLED FLYING-SPOT SCANNER [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (01): : 65 - 68

[1] CONTACTLESS SCANNER FOR PHOTOACTIVE MATERIALS USING LASER-INDUCED MICROWAVE-ABSORPTION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 197 - 201

[2] BOGENSCHUTZ AF, 1967, ATZPRAXIS HALBLEITER, P190

[3] CHEMINSKY G, 1984, P MRS EUROPE STRASBO

[4] AUTOMATIC LASER SCANNER FOR SOLAR-CELLS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (10) : 1580 - 1584

[5] KITTEL C, 1983, EINFUHRUNG FESTKORPE, P469

[6] THE STUDY OF CHARGE CARRIER KINETICS IN SEMICONDUCTORS BY MICROWAVE CONDUCTIVITY MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (10) : 3558 - 3566

[7] LEAMY HJ, 1982, J APPL PHYS, V53, pR57

[8] MICROWAVE PHOTOELECTROCHEMISTRY OF N-WSE2 [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (10) : 2212 - 2213

[9] SILICON-HYDROGEN INTERACTION SEEN BY MICROWAVE-PHOTOELECTROCHEMICAL TECHNIQUES [J]. CHEMICAL PHYSICS LETTERS, 1987, 142 (06) : 546 - 550

[10] MINORITY-CARRIER LIFETIME MAPPING IN SILICON USING A MICROPROCESSOR-CONTROLLED FLYING-SPOT SCANNER [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (01): : 65 - 68