DIELECTRIC LOSS AND CURRENT-VOLTAGE MEASUREMENTS IN SODIUM-CONTAMINATED SI-SIO2-CR STRUCTURES

被引：15

作者：

KRIEGLER, RJ ^{[1
]}

BARTNIKA.R ^{[1
]}

机构：

[1] BELL CANADA NO ELECT RES LTD,RES & DEVICE DEV DIV,ONTARIO,CANADA

来源：

关键词：

D O I：

10.1109/T-ED.1973.17734

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：722 / 731

页数：10

共 20 条

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[4] HARRIS WP, 1966, NAT ACAD SCI ANN REP, P72
[5] HOFSTEIN SR, 1967, IEEE T ELECTRON DEVI, VED14, P749
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[7] KERR DR, 1966 SPR M EL SOC CL
[8] KRIEGLER RJ, 1970 SPR M EL SOC LO
[9] KRIEGLER RJ, 1970, IEEE T ELECTRON DEVI, VED17, P1010
[10] IONIC CONTAMINATION AND TRANSPORT OF MOBILE IONS IN MOS STRUCTURES
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SILVERSMITH, DJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (06) : 966 - +