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IONIC CONTAMINATION AND TRANSPORT OF MOBILE IONS IN MOS STRUCTURES
被引:123
作者
:
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
SILVERSMITH, DJ
论文数:
0
引用数:
0
h-index:
0
SILVERSMITH, DJ
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1971年
/ 118卷
/ 06期
关键词
:
D O I
:
10.1149/1.2408233
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:966 / +
页数:1
相关论文
共 15 条
[1]
FLAME EMISSION ANALYSIS FOR SODIUM IN SILICON OXIDE FILMS AND ON SILICON SURFACES
BARRY, JE
论文数:
0
引用数:
0
h-index:
0
BARRY, JE
DONEGA, HM
论文数:
0
引用数:
0
h-index:
0
DONEGA, HM
BURGESS, TE
论文数:
0
引用数:
0
h-index:
0
BURGESS, TE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(02)
: 257
-
&
[2]
STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES
BUCK, TM
论文数:
0
引用数:
0
h-index:
0
BUCK, TM
ALLEN, FG
论文数:
0
引用数:
0
h-index:
0
ALLEN, FG
DALTON, JV
论文数:
0
引用数:
0
h-index:
0
DALTON, JV
STRUTHERS, JD
论文数:
0
引用数:
0
h-index:
0
STRUTHERS, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(08)
: 862
-
+
[3]
CHOU NJ, 1970, MAY LOS ANG M SOC
[4]
AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(02)
: 222
-
+
[5]
PROTON AND SODIUM TRANSPORT IN SIO2 FILMS
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1967,
ED14
(11)
: 749
-
+
[6]
KERR DR, 1969, MAY NEW YORK M SOC
[7]
KERR DR, 1969, JUN C PROP US MIS ST
[8]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[9]
KUHN M, 1970, OCT ATL CIT M SOC
[10]
DETERMINATION OF SODIUM IN ULTRAPURE SILICON AND SILICON DIOXIDE FILMS BY ACTIVATION ANALYSIS
OSBORNE, JF
论文数:
0
引用数:
0
h-index:
0
OSBORNE, JF
LARRABEE, GB
论文数:
0
引用数:
0
h-index:
0
LARRABEE, GB
HARRAP, V
论文数:
0
引用数:
0
h-index:
0
HARRAP, V
[J].
ANALYTICAL CHEMISTRY,
1967,
39
(10)
: 1144
-
&
←
1
2
→
共 15 条
[1]
FLAME EMISSION ANALYSIS FOR SODIUM IN SILICON OXIDE FILMS AND ON SILICON SURFACES
BARRY, JE
论文数:
0
引用数:
0
h-index:
0
BARRY, JE
DONEGA, HM
论文数:
0
引用数:
0
h-index:
0
DONEGA, HM
BURGESS, TE
论文数:
0
引用数:
0
h-index:
0
BURGESS, TE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(02)
: 257
-
&
[2]
STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES
BUCK, TM
论文数:
0
引用数:
0
h-index:
0
BUCK, TM
ALLEN, FG
论文数:
0
引用数:
0
h-index:
0
ALLEN, FG
DALTON, JV
论文数:
0
引用数:
0
h-index:
0
DALTON, JV
STRUTHERS, JD
论文数:
0
引用数:
0
h-index:
0
STRUTHERS, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(08)
: 862
-
+
[3]
CHOU NJ, 1970, MAY LOS ANG M SOC
[4]
AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(02)
: 222
-
+
[5]
PROTON AND SODIUM TRANSPORT IN SIO2 FILMS
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1967,
ED14
(11)
: 749
-
+
[6]
KERR DR, 1969, MAY NEW YORK M SOC
[7]
KERR DR, 1969, JUN C PROP US MIS ST
[8]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[9]
KUHN M, 1970, OCT ATL CIT M SOC
[10]
DETERMINATION OF SODIUM IN ULTRAPURE SILICON AND SILICON DIOXIDE FILMS BY ACTIVATION ANALYSIS
OSBORNE, JF
论文数:
0
引用数:
0
h-index:
0
OSBORNE, JF
LARRABEE, GB
论文数:
0
引用数:
0
h-index:
0
LARRABEE, GB
HARRAP, V
论文数:
0
引用数:
0
h-index:
0
HARRAP, V
[J].
ANALYTICAL CHEMISTRY,
1967,
39
(10)
: 1144
-
&
←
1
2
→