CAVITY-COUPLED JOSEPHSON DEVICE

被引：13

作者：

LONGACRE, A

机构：

[1] Moore School of Electrical Engineering, University of Pennsylvania, Philadelphia

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 10期

关键词：

D O I：

10.1063/1.325738

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The interaction of a resistance-shunted Josephson junction with a tightly coupled resonant circuit has been examined analytically and in simulation. Parametric dependences are developed and demonstrated for the size of resonance-induced current steps in the device's V-I curve and the corresponding level of excitation of the resonance.

引用

页码：6451 / 6454

页数：4

共 6 条

[1] MICROWAVE EMMISSION FROM SUPERCONDUCTING POINT-CONTACTS - [SUPERCONDUCTING DIODES - EFFECT OF CONTACT PRESSURE - VOLTAGE STANDARDS - FUNDAMENTAL CONSTANT (E/H) MEASUREMENT - E] [J].