ANALYTICAL MICROSCOPY BY SECONDARY ION IMAGING TECHNIQUES

[1] ANDERSEN CA, 1975, NBS SPEC PUBL, V427, P79

[2] DEPTH RESOLUTION OF SPUTTER PROFILING [J]. APPLIED PHYSICS, 1979, 18 (02): : 131 - 140

[3] CRYSTALLINE TRANSPARENCY AND ANISOTROPY EFFECTS ON BACKSCATTERED NOBLE-GAS IONS [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 615 - 621

[4] Bernheim M., 1973, International Journal of Mass Spectrometry and Ion Physics, V10, P293, DOI 10.1016/0020-7381(73)83007-4

[5] BERNHEIM M, 1980, J MICROSC SPECT ELEC, V5, P261

[6] BERNHEIM M, 1976, INT J MASS SPECTROM, V20, P295, DOI 10.1016/0020-7381(76)80156-8

[7] Bernheim M., 1973, Radiation Effects, V18, P231, DOI 10.1080/00337577308232127

[8] Bernheim M., 1977, J PHYSL PARIS L, V38, P325

[9] BERNHEIM M, 1974, 7TH T INT C XRAY OPT

[10] Bernheim M., 1979, SPRINGER SERIES CHEM, V9, P40, DOI 10.1007/978-3-642-61871-012

[1] ANDERSEN CA, 1975, NBS SPEC PUBL, V427, P79

[2] DEPTH RESOLUTION OF SPUTTER PROFILING [J]. APPLIED PHYSICS, 1979, 18 (02): : 131 - 140

[3] CRYSTALLINE TRANSPARENCY AND ANISOTROPY EFFECTS ON BACKSCATTERED NOBLE-GAS IONS [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 615 - 621

[4] Bernheim M., 1973, International Journal of Mass Spectrometry and Ion Physics, V10, P293, DOI 10.1016/0020-7381(73)83007-4

[5] BERNHEIM M, 1980, J MICROSC SPECT ELEC, V5, P261

[6] BERNHEIM M, 1976, INT J MASS SPECTROM, V20, P295, DOI 10.1016/0020-7381(76)80156-8

[7] Bernheim M., 1973, Radiation Effects, V18, P231, DOI 10.1080/00337577308232127

[8] Bernheim M., 1977, J PHYSL PARIS L, V38, P325

[9] BERNHEIM M, 1974, 7TH T INT C XRAY OPT

[10] Bernheim M., 1979, SPRINGER SERIES CHEM, V9, P40, DOI 10.1007/978-3-642-61871-012