PROJECTION GEOMETRY OF FIELD-ION IMAGE

被引：16

作者：

SOUTHWORTH, HN ^{[1
]}

WALLS, JM ^{[1
]}

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT PHYS,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

来源：

关键词：

D O I：

10.1016/0039-6028(78)90057-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：129 / 140

页数：12

共 13 条

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[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (06): : 373 - &
[2] BRENNER SS, 1962, METAL SURFACES STRUC, P305
[3] GENERAL PROPERTIES OF FIELD-ION IMAGE PROJECTION
FORTES, MA
[J]. SURFACE SCIENCE, 1971, 28 (01) : 117 - &
[4] ION TRAJECTORIES IN FIELD-ION MICROSCOPE
GILLOTT, L
SUGDEN, J
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (12): : 1218 - 1220
[5] LEWIS RJ, 1975, 22ND INT FIELD EM S
[6] Muller E. W., 1960, ADV ELECTRON, V13, P83, DOI 10.1016/S0065-2539(08)60210-3
[7] A METHOD FOR INDEXING FIELD ION MICROGRAPHS
NEWMAN, RW
SANWALD, RC
HREN, JJ
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (10): : 828 - &
[8] OPTICAL TRANSFORMATION OF FIELD ION MICROGRAPHS
RENDULIC, KD
MULLER, EW
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (05) : 676 - &
[9] ON THE MAGNIFICATION AND RESOLUTION OF THE FIELD EMISSION ELECTRON MICROSCOPE
ROSE, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1956, 27 (03) : 215 - 220
[10] ION TRAJECTORIES IN FIELD-ION MICROSCOPE
SMITH, R
WALLS, JM
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (04) : 409 - 419