PACKAGING OF PRINTED-CIRCUIT LINES - A DANGEROUS CAUSE FOR NARROW PULSE DISTORTION

被引:14
作者
TSUJI, M
SHIGESAWA, H
机构
[1] Department of Electronics, Doshisha University, Tanabe, Kyoto
关键词
D O I
10.1109/22.310588
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report here a new behavioral feature of a narrow pulse transmitted on coplanar waveguide (CPW), putting the special stress on the effects caused by the packaging of such a waveguide. This feature occurs due to the unexpected simultaneous combination of a distortion in the guided main pulse and a production of delayed echo pulses. An explanation based on a new class of the dominant-mode power-leakage effect leads to a clear physical understanding of why such features necessarily appear.
引用
收藏
页码:1784 / 1790
页数:7
相关论文
共 15 条
[1]  
AUSTON DH, 1988, ULTRASHORT LASER PUL
[2]  
DRAGOMAN M, 1993, ULTRA WIDEBAND SHORT
[3]   EXPERIMENTS ON KDV SOLITONS [J].
JAGER, D .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1982, 51 (05) :1686-1693
[4]   PICOSECOND OPTICS AND MICROWAVE TECHNOLOGY [J].
LEE, CH .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (05) :596-607
[5]  
NGHIEM D, 1991, JUN IEEE INT MICR S, P567
[6]   GAAS NONLINEAR TRANSMISSION-LINES FOR PICOSECOND PULSE GENERATION AND MILLIMETER-WAVE SAMPLING [J].
RODWELL, MJW ;
KAMEGAWA, M ;
YU, R ;
CASE, M ;
CARMAN, E ;
GIBONEY, KS .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (07) :1194-1204
[7]   500 GHZ GAAS MMIC SAMPLING WAFER PROBE [J].
SHAKOURI, MS ;
BLACK, A ;
AULD, BA ;
BLOOM, DM .
ELECTRONICS LETTERS, 1993, 29 (06) :557-558
[8]  
SHIGESAWA H, 1993, 23RD P EUR MICR C MA
[9]  
SHIGESAWA H, 1991, T IEICE JAPAN E, V74, P1264
[10]   NEW INTERESTING LEAKAGE BEHAVIOR ON COPLANAR WAVE-GUIDES OF FINITE AND INFINITE WIDTHS [J].
TSUJI, M ;
SHIGESAWA, H ;
OLINER, AA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (12) :2130-2137