LOW-TEMPERATURE ULTRA-HIGH-VACUUM SCANNING TUNNELING MICROSCOPE

被引：104

作者：

GAISCH, R ^{[1
]}

GIMZEWSKI, JK ^{[1
]}

REIHL, B ^{[1
]}

SCHLITTLER, RR ^{[1
]}

TSCHUDY, M ^{[1
]}

SCHNEIDER, WD ^{[1
]}

机构：

[1] UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

关键词：

D O I：

10.1016/0304-3991(92)90495-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We describe a new scanning tunneling microscope designed specifically for use in an ultra-high-vacuum low-temperature environment. The concept is based on an instrument with interchangeable tip, probe, and a remotely manipulated STM head. The instrumental performance and initial images of a Au(110)(1x2) reconstructed surface obtained with atomic resolution at T almost-equal-to 10 K are presented.

引用

页码：1621 / 1626

页数：6

共 15 条

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