MICROCOMPUTER APPROACH TO ELEMENTAL DEPTH PROFILING WITH AUGER-ELECTRON SPECTROMETRY

被引:10
作者
GRIFFIS, DP [1 ]
WOODWARD, WS [1 ]
LINTON, RW [1 ]
机构
[1] UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
关键词
D O I
10.1021/ac00237a064
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:2377 / 2379
页数:3
相关论文
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[3]   USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J].
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SHAFFNER TJ, 1980, SCANNING ELECTRON MI, V1, P479
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Solomon J. S., 1976, American Laboratory, V8, P31
[6]  
WOODWARD WS, 1980, 179TH NAT M AM CHEM