OPTICS IN A HOSTILE ENVIRONMENT

被引:12
作者
DYSON, J
机构
[1] National Physical Laboratory, Teddington, Middlesex
来源
APPLIED OPTICS | 1968年 / 7卷 / 04期
关键词
D O I
10.1364/AO.7.000569
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The hostile environment is defined for the purposes of this paper and modes of hostility due to physical, human, and economic factors are outlined. An account is given of some ways in which the optical methods can be defended against the inimical physical and human factors by the functional design of the apparatus with some examples which have proved successful in practice. The influence of economics is discussed, together with its implications for the designer of optical instruments. © 1968 Optical Society of America.
引用
收藏
页码:569 / &
相关论文
共 19 条
[1]   A WAVEFRONT SHEARING INTERFEROMETER [J].
BATES, WJ .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1947, 59 (336) :940-&
[2]   SCATTER FRINGES OF EQUAL THICKNESS [J].
BURCH, JM .
NATURE, 1953, 171 (4359) :889-890
[3]   THE RAPID MEASUREMENT OF PHOTOGRAPHIC RECORDS OF INTERFERENCE FRINGES [J].
DYSON, J .
APPLIED OPTICS, 1963, 2 (05) :487-489
[4]   COMMON-PATH INTERFEROMETER FOR TESTING PURPOSES [J].
DYSON, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (05) :386-390
[5]   PRECISE MEASUREMENT BY IMAGE-SPLITTING [J].
DYSON, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (08) :754-757
[6]   POSSIBLE IMMUNITIES IN INTERFEROMETER END MIRRORS [J].
DYSON, J .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (11) :823-&
[7]   ELECTRICAL READ-OUT FROM OPTICAL ALIGNMENT DEVICES [J].
DYSON, J ;
NOBLE, PJW .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (05) :311-&
[8]   VERY PRECISE THICKNESS MEASUREMENT OF THIN FILMS [J].
DYSON, J .
NATURE, 1963, 197 (487) :1193-&
[9]  
DYSON J, 1962, J ROY MICROSC SOC, V81, P95
[10]  
DYSON J, 1963, J OPT SOC AM, V53, P190