COMPARISON OF SURFACE ANALYSIS USING ION SCATTERING, ION-PRODUCED PHOTONS, AND SECONDARY ION EMISSION

被引：17

作者：

MACDONALD, RJ ^{[1
]}

HEILAND, W ^{[1
]}

TAGLAUER, E ^{[1
]}

机构：

[1] MAX PLANCK INST PLASMA PHYS,EURATOM,D-8046 GARCHING,FED REP GER

来源：

APPLIED PHYSICS LETTERS | 1978年 / 33卷 / 07期

关键词：

D O I：

10.1063/1.90465

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：576 / 578

页数：3

共 9 条

[1] SIMILARITIES IN PHOTON AND ION EMISSIONS INDUCED BY SPUTTERING [J].

BLAISE, G .

SURFACE SCIENCE, 1976, 60 (01) :65-75

[2]

ENGLERT W, 1978, VERH DTSCH GES PATHO, V2, P592

[3] DIRECT COMPARISON OF ION SCATTERING AND SECONDARY ION EMISSION AS TOOLS FOR ANALYSIS OF METAL-SURFACES [J].

GRUNDNER, M ;

HEILAND, W ;

TAGLAUER, E .

APPLIED PHYSICS, 1974, 4 (03) :243-248

[4] BOMBARDMENT-INDUCED PHOTON EMISSION FROM A1 AND A12O3 TARGETS [J].

KELLY, R ;

KERKDIJK, CB .

SURFACE SCIENCE, 1974, 46 (02) :537-557

[5] STUDY OF INTERACTION OF OXYGEN WITH CHROMIUM USING ION-BOMBARDMENT INDUCED PHOTON AND SECONDARY ION EMISSION [J].

MACDONALD, RJ ;

MARTIN, PJ .

SURFACE SCIENCE, 1977, 67 (01) :237-250

[6] CONTRIBUTION TO INVESTIGATION OF ION IMPACT DESORPTION BY ION SCATTERING [J].

TAGLAUER, E ;

MARIN, G ;

HEILAND, W .

APPLIED PHYSICS, 1977, 13 (01) :47-49

[7]

TAGLAUER E, 1977, 3RD INT C ION BEAM A

[8]

1977, P C ION BEAM CHARACT

[9]

1975, P C ION BEAM CHARACT

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