DIRECT COMPARISON OF ION SCATTERING AND SECONDARY ION EMISSION AS TOOLS FOR ANALYSIS OF METAL-SURFACES

被引：30

作者：

GRUNDNER, M ^{[1
]}

HEILAND, W ^{[1
]}

TAGLAUER, E ^{[1
]}

机构：

[1] MAX PLANCK INST PLASMA PHYS, EURATOM, D-8046 GARCHING, WEST GERMANY

来源：

APPLIED PHYSICS | 1974年 / 4卷 / 03期

关键词：

D O I：

10.1007/BF00884235

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：243 / 248

页数：6

共 25 条

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