THE X-RAY ANOMALOUS DISPERSION CORRECTIONS AND THEIR USE FOR THE CHARACTERIZATION OF MATERIALS

被引:3
作者
CREAGH, DC
机构
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷
关键词
D O I
10.1016/0146-3535(87)90015-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
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页码:1 / 46
页数:46
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共 161 条
[1]  
Aberg T., 1985, ATOMIC INNER SHELL P
[2]   FERROELECTRIC LITHIUM NIOBATE .3. SINGLE CRYSTAL X-RAY DIFFRACTION STUDY AT 24 DEGREES C [J].
ABRAHAMS, SC ;
REDDY, JM ;
BERNSTEIN, JL .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1966, 27 (6-7) :997-+
[3]  
ABRAHAMS SC, 1975, ANOMALOUS SCATTERING, P199
[4]  
AKHIEZER AI, 1957, QUANTUM ELECTRODYNAM
[5]   ELECTRON-DISTRIBUTION IN SILICON .2. THEORETICAL INTERPRETATION [J].
ALDRED, PJE ;
HART, M .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :239-254
[6]   ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J].
ALDRED, PJE ;
HART, M .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :223-+
[7]   DYNAMICAL CONTRAST OF TOPOGRAPHIC IMAGE OF A CRYSTAL WITH CONTINUOUS X-RAY-RADIATION .1. EXPERIMENTAL-OBSERVATION OF POLYCHROMATIC INTERFERENCE-FRINGES AND THEIR APPLICATION FOR INVESTIGATION OF ANOMALOUS SCATTERING OF X-RAYS BY PERFECT CRYSTALS [J].
ARISTOV, VV ;
SHMYTKO, IM ;
SHULAKOV, EV .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (MAY1) :412-&
[8]   THEORY OF EXTENDED X-RAY ABSORPTION-EDGE FINE-STRUCTURE (EXAFS) IN CRYSTALLINE SOLIDS [J].
ASHLEY, CA ;
DONIACH, S .
PHYSICAL REVIEW B, 1975, 11 (04) :1279-1288
[9]   QUANTUM FIELD THEORY OF OPTICAL BIREFRINGENCE PHENOMENA .I. LINEAR AND NONLINEAR OPTICAL ROTATION [J].
ATKINS, PW ;
BARRON, LD .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1968, 304 (1478) :303-&
[10]  
AZAROFF LV, 1974, XRAY SPECTROSCOPY