THE X-RAY ANOMALOUS DISPERSION CORRECTIONS AND THEIR USE FOR THE CHARACTERIZATION OF MATERIALS

被引:3
作者
CREAGH, DC
机构
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷
关键词
D O I
10.1016/0146-3535(87)90015-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:1 / 46
页数:46
相关论文
共 161 条
[11]  
BARNEA Z, 1975, ANOMALOUS SCATTERING, P289
[12]   UNIQUE PHASE DETERMINATION ON BASIS OF BIJVOET RATIOS BY MEANS OF RESONANT NEUTRON-SCATTERING [J].
BARTUNIK, HD .
ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (SEP) :747-750
[13]   DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J].
BATTERMAN, BW .
PHYSICAL REVIEW LETTERS, 1969, 22 (14) :703-+
[14]   X-ray wave-lengths by the dispersion in quartz [J].
Bearden, JA .
PHYSICAL REVIEW, 1932, 39 (01) :1-7
[15]   The refraction of the copper K-Series by quartz [J].
Bearden, JA .
PHYSICAL REVIEW, 1931, 38 (04) :835-836
[16]   DETERMINATION OF THE ABSOLUTE CONFIGURATION OF OPTICALLY ACTIVE COMPOUNDS BY MEANS OF X-RAYS [J].
BIJVOET, JM ;
PEERDEMAN, AF ;
VANBOMMEL, AJ .
NATURE, 1951, 168 (4268) :271-272
[17]  
BOEHM JM, 1977, THESIS MELBOURNE U
[18]  
BONSE U, 1984, NUCL INSTRUM METH A, V222, P185, DOI 10.1016/0167-5087(84)90526-X
[19]   INTERFEROMETRIC MEASUREMENT OF REFRACTIVE INDEX FOR X-RAYS [J].
BONSE, U ;
HELLKOTTER, H .
ZEITSCHRIFT FUR PHYSIK, 1969, 223 (04) :345-+
[20]   AN X-RAY INTERFEROMETER [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&