SURFACE PHENOMENA IN RHEED AND REM

被引：7

作者：

MA, Y ^{[1
]}

MARKS, LD ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,MAT RES CTR,EVANSTON,IL 60208

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1990年 / 46卷

关键词：

D O I：

10.1107/S0108767390002781

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：594 / 606

页数：13

共 39 条

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[4] THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY
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[8] MANY-BEAM CALCULATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) INTENSITIES BY THE MULTI-SLICE METHOD
ICHIMIYA, A
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (01): : 176 - 180
[9] SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (06) : 891 - 908
[10] AN INVESTIGATION OF THE SI(111) 7X7 SURFACE-STRUCTURE BY RHEED
INO, S
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) : 1277 - 1290

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