LOCAL-STRUCTURE OF CUINSE2 THIN-FILM STUDIED BY EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引:13
作者
KUWAHARA, Y
OYANAGI, H
YAMAGUCHI, H
AONO, M
SHIRAKATA, S
ISOMURA, S
机构
[1] ELECTROTECH LAB,TSUKUBA,IBARAKI 305,JAPAN
[2] EHIME UNIV,FAC ENGN,MATSUYAMA,EHIME 790,JAPAN
关键词
D O I
10.1063/1.357895
中图分类号
O59 [应用物理学];
学科分类号
摘要
The local structure of CuInSe2 thin films has been studied by extended x-ray absorption fine structure on the Cu K and Se K edges using synchrotron radiation. The Cu - Se and In - Se bond lengths are examined as a function of In/Cu ratio α (0.29<α<1.13). The results show that the local structure of the thin-film CuInSe2 is quite similar to that of the bulk crystal over a wide range of α; however, it is found that with decreasing α, the Cu - Se and In - Se bond lengths deviate systematically from those of the stoichiometric bulk CuInSe2 crystal, which is attributed to the chemical disorder of the cation sites and the formation of anion vacancies in the chalcopyrite lattice. The temperature dependencies of mean-square relative displacements indicate that the In - Se bond is stronger than the Cu - Se bond. © 1994 American Institute of Physics.
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页码:7864 / 7869
页数:6
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