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RELIABILITY AND FAILURE MECHANISMS OF ELECTRONIC MATERIALS

被引：10
作者：
ENGLISH, AT
MELLIARSMITH, CM
机构：
来源：
ANNUAL REVIEW OF MATERIALS SCIENCE | 1978年 / 8卷
关键词：
D O I：
10.1146/annurev.ms.08.080178.002331
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：459 / 495
页数：37
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