C-V CHARACTERISTICS OF "AL-VACUUM-EVAPORATED-SIOX(1-2)-GAAS SYSTEMS

被引：7

作者：

HIRAMATSU, T

GOTO, H

HIROBE, T

HIROFUJI, Y

KIMATA, M

机构：

[1] Department of Electrical Engineering, School of Science and Engineering, Waseda University

来源：

关键词：

D O I：

10.1143/JJAP.18.853

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

[No abstract available]

引用

页码：853 / 854

页数：2

相关论文

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[2] ELECTRICAL CONDUCTIVITY IN EVAPORATED SILICON OXIDE FILMS [J].

JOHANSEN, IT .

SAWADA, T ;

HASEGAWA, H .