K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS

被引：210

作者：

EGERTON, RF

机构：

[1] Physics Department, University of Alberta, Edmonton

来源：

ULTRAMICROSCOPY | 1979年 / 4卷 / 02期

关键词：

D O I：

10.1016/S0304-3991(79)90157-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A hydrogenic model with Zener screening constant is used to calculate generalized oscillator strengths of K-shell ionization, the optical values showing good agreement with X-ray absorption data. Energy-differential, partial, integral and total K-shell cross-sections are computed using the Born approximation for elements of low atomic number hombarded by electrons of energy >30 keV. The results appear to be consitent with Auger, X-ray and energy-loss measurements. The calculations can be performed rapidly using a short computer program, enabling quantitative results to be obtained from electron energy loss spectrometry. © 1979 North-Holland Publishing Company.

引用

页码：169 / 179

页数：11