DC AND AC RESISTANCE OF MANGANESE AND MN-SIO THIN-FILMS

被引：7

作者：

CASTRO, EM

BEYNON, J

机构：

来源：

THIN SOLID FILMS | 1980年 / 66卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90233-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：L21 / L23

页数：3

相关论文

共 4 条

[1] ELECTRICAL RESISTIVITY AND STRUCTURAL-PROPERTIES OF EVAPORATED MANGANESE SILICON OXIDE CERMET FILMS [J].

BEYNON, J ;

MILWAY, NRP .

THIN SOLID FILMS, 1972, 14 (02) :387-396

[2] VARIATION OF RESISTIVITY WITH DEPOSITION RATE FOR PURE MN AND MN-MGF2 CERMET FILMS [J].

BEYNON, J ;

OLUMEKOR, L .

THIN SOLID FILMS, 1977, 41 (01) :29-33

[3]

CASTRO E, 1979, THESIS BRUNEL U

[4] LOW-FREQUENCY CONDUCTIVITY DUE TO HOPPING PROCESSES IN SILICON [J].

POLLAK, M ;

GEBALLE, TH .

PHYSICAL REVIEW, 1961, 122 (06) :1742-&