ELECTRICAL RESISTIVITY AND STRUCTURAL-PROPERTIES OF EVAPORATED MANGANESE SILICON OXIDE CERMET FILMS

被引:14
作者
BEYNON, J [1 ]
MILWAY, NRP [1 ]
机构
[1] BRUNEL UNIV, DEPT PHYS, UXBRIDGE, MIDDLESEX, ENGLAND
关键词
D O I
10.1016/0040-6090(72)90438-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:387 / 396
页数:10
相关论文
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