A NEW PATTERNING PROCESS CONCEPT FOR LARGE-AREA TRANSISTOR-CIRCUIT FABRICATION WITHOUT USING AN OPTICAL MASK ALIGNER

被引:50
作者
MIKAMI, Y
NAGAE, Y
MORI, Y
KUWABARA, K
SAITO, T
HAYAMA, H
ASADA, H
AKIMOTO, Y
KOBAYASHI, M
OKAZAKI, S
ASAKA, K
MATSUI, H
NAKAMURA, K
KANEKO, E
机构
[1] Giant Electronics Research Laboratory, GTC Corporation, Higashi Nihonbashi, Chu-o-ku Tokyo
关键词
D O I
10.1109/16.275214
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new concept to produce large thin film transister liquid crystal displays (TFT-LCD's) without using an optical mask aligner is proposed which emphasizes patterning technology. Some experimental thin film transistors (TFT's) are fabricated according to the concept and operated like conventional transistors fabricated by using an optical mask aligner. The concept includes improvement of printing technology and development of a double-layer resist method. The latter method employs a printed ink pattern and a photoresist. This prevents contamination of thin films by metal impurities which affect electrical characteristics of the TFT's. A special gravure offset printing technology is proposed, composed of a large thixotropy valued UV ink, and a fine, precision etched glass intaglio. The experimental TFT's, with a designed minimum gate length of 10 mu m, have comparable electric characteristics to those of conventional poly-Si TFT's.
引用
收藏
页码:306 / 314
页数:9
相关论文
共 16 条
  • [1] ASHIZAKI S, 1986, 6TH P INT DISPL RES, V86, P226
  • [2] CURRENT UNDERSTANDING OF CHARGES IN THERMALLY OXIDIZED SILICON STRUCTURE
    DEAL, BE
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (06) : C198 - C205
  • [3] HAYAMA H, 1991, 1991 INT S SOC INF D, P565
  • [4] Ichikawa K., 1989, 1989 SID International Symposium. Digest of Technical Papers, P226
  • [5] KANEKO E, 1990, 1990 INT C SOL STAT, P937
  • [6] MORI Y, 1991, 1991 INT S SOC INF D, P561
  • [7] Morozumi S., 1984, 1984 SID International Symposium. Digest of Technical Papers, P316
  • [8] NAGAYASU T, 1988, 1988 C REC INT DISPL, P56
  • [9] OANA Y, 1984, SID 84, P312
  • [10] OHWADA J, 1988, 1988 P INT DISPL RES, P215