OPTICAL CONSTANTS OF SILVER SULFIDE TARNISH FILMS

被引：123

作者：

BENNETT, JM

STANFORD, JL

ASHLEY, EJ

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1970年 / 60卷 / 02期

关键词：

D O I：

10.1364/JOSA.60.000224

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：224 / &

共 26 条

[1]

[Anonymous], HELV PHYS ACTA

[2]

BAILLY R, 1948, AM MINERAL, V33, P519

[3] FORMATION AND GROWTH OF TARNISH ON EVAPORATED SILVER FILMS [J].

BENNETT, HE ;

PECK, RL ;

BURGE, DK ;

BENNETT, JM .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) :3351-&

[4] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J].

BENNETT, HE ;

KOEHLER, WF .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) :1-6

[5] VALIDITY OF ELLIPSOMETRY FOR DETERMINING AVERAGE THICKNESS OF THIN DISCONTINUOUS ABSORBING FILMS [J].

BENNETT, HE ;

BURGE, DK ;

PECK, RL ;

BENNETT, JM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1969, 59 (06) :675-&

[6] INFRARED REFLECTANCE OF EVAPORATED ALUMINUM FILMS [J].

BENNETT, HE ;

ASHLEY, EJ ;

BENNETT, JM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (11) :1245-&

[7]

BENNETT HE, 1967, PHYS THIN FILMS, V4, P12

[8]

BENNETT HE, 1967, PHYS THIN FILMS, V4, P31

[9]

BENNETT HE, 1967, PHYS THIN FILMS, V4, P42

[10]

BENNETT HE, 1964, J OPT SOC AM, V54, pA568

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