EXPERIMENTAL-DETERMINATION OF MINORITY-CARRIER LIFETIME AND RECOMBINATION MECHANISMS IN P-TYPE HG1-XCDXTE

被引：57

作者：

POLLA, DL

TOBIN, SP

REINE, MB

SOOD, AK

机构：

[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139

[2] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139

来源：

关键词：

D O I：

10.1063/1.329421

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5182 / 5194

页数：13

共 38 条

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[8] ELECTRON-BEAM EXCITED MINORITY-CARRIER DIFFUSION PROFILES IN SEMICONDUCTORS
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