共 9 条
- [1] AN ANALYSIS OF ANGULAR DEPENDENT XPS PEAK INTENSITIES [J]. SURFACE SCIENCE, 1985, 154 (2-3) : L225 - L232
- [2] DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION [J]. PHYSICAL REVIEW B, 1985, 31 (02): : 1212 - 1215
- [3] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION [J]. PHYSICAL REVIEW B, 1985, 32 (08): : 4872 - 4875
- [4] X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR STUDYING EPITAXIAL-GROWTH AND CORE-LEVEL BINDING-ENERGY SHIFTS [J]. PHYSICAL REVIEW B, 1984, 30 (02): : 1052 - 1055
- [6] CHEMISORPTION GEOMETRY OF C (2X2) OXYGEN ON CU (001) FROM ANGLE-RESOLVED CORE-LEVEL X-RAY PHOTOEMISSION [J]. PHYSICAL REVIEW B, 1980, 22 (12): : 6085 - 6103
- [9] REAL-SPACE INTERPRETATION OF X-RAY-EXCITED AUGER-ELECTRON DIFFRACTION FROM CU(001) [J]. PHYSICAL REVIEW B, 1988, 37 (08): : 3959 - 3963