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REAL-SPACE INTERPRETATION OF X-RAY-EXCITED AUGER-ELECTRON DIFFRACTION FROM CU(001)

被引：51
作者：
LI, H
TONNER, BP
机构：
[1] UNIV WISCONSIN,DEPT PHYS,1900 E KENWOOD BLVD,MILWAUKEE,WI 53211
[2] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53211
来源：
PHYSICAL REVIEW B | 1988年 / 37卷 / 08期
关键词：
D O I：
10.1103/PhysRevB.37.3959
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：3959 / 3963
页数：5
相关论文
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  • [1] AN ANALYSIS OF ANGULAR DEPENDENT XPS PEAK INTENSITIES
    ARMSTRONG, RA
    EGELHOFF, WF
    [J]. SURFACE SCIENCE, 1985, 154 (2-3) : L225 - L232
  • [2] DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION
    BULLOCK, EL
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    [J]. PHYSICAL REVIEW B, 1985, 31 (02): : 1212 - 1215
  • [3] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION
    CHAMBERS, SA
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    [J]. PHYSICAL REVIEW B, 1985, 32 (08): : 4872 - 4875
  • [4] GROWTH OF METASTABLE FCC CO ON NI(001)
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  • [5] HIGH-TEMPERATURE NUCLEATION AND SILICIDE FORMATION AT THE CO/SI(111)-7X7 INTERFACE - A STRUCTURAL INVESTIGATION
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    [J]. PHYSICAL REVIEW B, 1986, 34 (02): : 913 - 920
  • [6] ANGLE-RESOLVED AUGER-ELECTRON EMISSION FROM LAB6(001) WITH AND WITHOUT CHEMISORBED OXYGEN
    CHAMBERS, SA
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    [J]. SURFACE SCIENCE, 1983, 131 (2-3) : 385 - 402
  • [7] ATOMIC-STRUCTURE OF THE CU/SI(111) INTERFACE BY HIGH-ENERGY CORE-LEVEL AUGER-ELECTRON DIFFRACTION
    CHAMBERS, SA
    ANDERSON, SB
    WEAVER, JH
    [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 581 - 587
  • [8] DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001)
    CHAMBERS, SA
    CHEN, HW
    VITOMIROV, IM
    ANDERSON, SB
    WEAVER, JH
    [J]. PHYSICAL REVIEW B, 1986, 33 (12): : 8810 - 8813
  • [9] THEORETICAL MODELING AND EXPERIMENTAL TESTING OF A MULTIMODE OPTICAL-SYSTEM AND ENERGY ANALYZER FOR ELECTRON-SPECTROSCOPY
    CHOU, YC
    ROBRECHT, MJ
    TONNER, BP
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (07) : 1164 - 1172
  • [10] QUANTITATIVE-ANALYSIS OF A SUBMONOLAYER ADSORPTION SYSTEM BY ANGLE RESOLVED XPS - C(2X2)S ON NI(001)
    CONNELLY, RE
    FADLEY, CS
    ORDERS, PJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (03): : 1333 - 1338
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