QUANTITATIVE-ANALYSIS OF A SUBMONOLAYER ADSORPTION SYSTEM BY ANGLE RESOLVED XPS - C(2X2)S ON NI(001)

被引：16

作者：

CONNELLY, RE ^{[1
]}

FADLEY, CS ^{[1
]}

ORDERS, PJ ^{[1
]}

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1984年 / 2卷 / 03期

关键词：

D O I：

10.1116/1.572404

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1333 / 1338

页数：6

共 35 条

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[5] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .7. THE EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE ANGULAR-DISTRIBUTION OF PHOTOELECTRONS ESCAPING FROM SAMPLES COVERED WITH THIN-FILMS OF VARIOUS THICKNESSES
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[6] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .4. EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE FREE-PATH OF ELECTRONS AND THEIR ANGULAR-DISTRIBUTION
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[7] STRUCTURE DETERMINATION OF C(2X2) S ON NI(100) USING POLARIZATION-DEPENDENT SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE
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[8] BRUNDLE CR, 1978, ELECTRON SPECTROSCOP, V2
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[J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (04) : 125 - 134
[10] CRYSTALLOGRAPHIC DEPENDENCE OF CHEMISORPTION BONDING FOR SULFUR ON (001), (110), AND (111) NICKEL
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