OPTICAL-PROPERTIES OF VANADIUM SILICIDE POLYCRYSTALLINE FILMS

被引：10

作者：

BORGHESI, A

PIAGGI, A

GUIZZETTI, G

NAVA, F

BACCHETTA, M

机构：

[1] UNIV MODENA,DEPARTIMENTO FIS,I-41100 MODENA,ITALY

[2] ST SGS THOMSON MICROELECTR,AGRATE BRIANZA MI,ITALY

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.40.3249

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3249 / 3253

页数：5

共 23 条

[1] THEORETICAL STUDIES OF THE OPTICAL AND ELECTRONIC PROPERTIES OF V, NB, AND TA [J].

ALWARD, JF ;

FONG, CY ;

SRIDHAR, CG .

PHYSICAL REVIEW B, 1978, 18 (10) :5438-5448

[2] EXPERIMENTAL BAND-STRUCTURE (ERK) OF V3SI BY ANGLE-RESOLVED PHOTOEMISSION [J].

AONO, M ;

HIMPSEL, FJ ;

EASTMAN, DE .

SOLID STATE COMMUNICATIONS, 1981, 39 (02) :225-228

[3] TREND STUDIES OF A15 COMPOUNDS BY SELF-CONSISTENT BAND CALCULATIONS [J].

ARBMAN, G ;

JARLBORG, T .

SOLID STATE COMMUNICATIONS, 1978, 26 (11) :857-861

[4] ELECTRONIC-STRUCTURE OF VANADIUM SILICIDES [J].

BISI, O ;

CHIAO, LW .

PHYSICAL REVIEW B, 1982, 25 (08) :4943-4948

[5] OPTICAL-PROPERTIES OF TANTALUM DISILICIDE THIN-FILMS [J].

BORGHESI, A ;

NOSENZO, L ;

PIAGGI, A ;

GUIZZETTI, G ;

NOBILI, C ;

OTTAVIANI, G .

PHYSICAL REVIEW B, 1988, 38 (15) :10937-10940

[6] OPTICAL-PROPERTIES OF SINGLE-CRYSTAL TITANIUM DISILICIDE [J].

BORGHESI, A ;

PIAGGI, A ;

GUIZZETTI, G ;

LEVY, F ;

TANAKA, M ;

FUKUTANI, H .

PHYSICAL REVIEW B, 1989, 40 (03) :1611-1615

[7] ELECTRONIC PROPERTIES OF SILICON-TRANSITION METAL INTERFACE COMPOUNDS [J].

Calandra, C. ;

Bisi, O. ;

Ottaviani, G. .

SURFACE SCIENCE REPORTS, 1985, 4 (5-6) :271-364

[8] CHEMICAL-REACTION AND SCHOTTKY-BARRIER FORMATION AT V/SI INTERFACES [J].

CLABES, JG ;

RUBLOFF, GW ;

TAN, TY .

PHYSICAL REVIEW B, 1984, 29 (04) :1540-1550

[9] OPTICAL-PROPERTIES OF WSI2 AND MOSI2 SINGLE-CRYSTALS AS MEASURED BY SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY [J].

FERRIEU, F ;

VIGUIER, C ;

CROS, A ;

HUMBERT, A ;

THOMAS, O ;

MADAR, R ;

SENATEUR, JP .

SOLID STATE COMMUNICATIONS, 1987, 62 (07) :455-459

[10] ELECTRONIC-STRUCTURE OF CR SILICIDES AND SI-CR INTERFACE REACTIONS [J].

FRANCIOSI, A ;

WEAVER, JH ;

ONEILL, DG ;

SCHMIDT, FA ;

BISI, O ;

CALANDRA, C .

PHYSICAL REVIEW B, 1983, 28 (12) :7000-7008

← 1 2 3 →