CARBON AS A BARRIER FOR THE OUTDIFFUSION OF CU

[1] BAGLIN JEE, 1980, ELECTROCHEM SOC P, P80

[2] BAGLIN JEE, 1984, MATER RES SOC S P, V25

[3] ION BACKSCATTERING ANALYSIS OF INTERDIFFUSION IN CU-AU THIN-FILMS [J]. THIN SOLID FILMS, 1973, 19 (02) : 359 - 370

[4] DETERMINATION OF CONCENTRATION PROFILE IN THIN METALLIC-FILMS - APPLICATIONS AND LIMITATIONS OF HE+ BACKSCATTERING [J]. THIN SOLID FILMS, 1975, 25 (02) : 431 - 440

[5] STRUCTURAL STUDIES OF THE EFFECTS OF SILVER AND GOLD ON THE YBACUO SUPERCONDUCTING FILMS FORMED FROM LAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) : 1991 - 1994

[6] INTERACTIONS BETWEEN AU AND CU ACROSS A NI BARRIER LAYER [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) : 1220 - 1222

[7] CHANG CA, 1988, J APPL PHYS, V52, P924

[8] CHANG CA, 1988, DIFFUSION PHENOMENA, P323

[9] Chin-An Chang, 1987, Journal of Materials Research, V2, P697, DOI 10.1557/JMR.1987.0697

[10] INTERDIFFUSION IN CU-AU THIN-FILM SYSTEM AT 25DEGREESC TO 250DEGREESC [J]. THIN SOLID FILMS, 1977, 41 (03) : 341 - 361

[1] BAGLIN JEE, 1980, ELECTROCHEM SOC P, P80

[2] BAGLIN JEE, 1984, MATER RES SOC S P, V25

[3] ION BACKSCATTERING ANALYSIS OF INTERDIFFUSION IN CU-AU THIN-FILMS [J]. THIN SOLID FILMS, 1973, 19 (02) : 359 - 370

[4] DETERMINATION OF CONCENTRATION PROFILE IN THIN METALLIC-FILMS - APPLICATIONS AND LIMITATIONS OF HE+ BACKSCATTERING [J]. THIN SOLID FILMS, 1975, 25 (02) : 431 - 440

[5] STRUCTURAL STUDIES OF THE EFFECTS OF SILVER AND GOLD ON THE YBACUO SUPERCONDUCTING FILMS FORMED FROM LAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) : 1991 - 1994

[6] INTERACTIONS BETWEEN AU AND CU ACROSS A NI BARRIER LAYER [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) : 1220 - 1222

[7] CHANG CA, 1988, J APPL PHYS, V52, P924

[8] CHANG CA, 1988, DIFFUSION PHENOMENA, P323

[9] Chin-An Chang, 1987, Journal of Materials Research, V2, P697, DOI 10.1557/JMR.1987.0697

[10] INTERDIFFUSION IN CU-AU THIN-FILM SYSTEM AT 25DEGREESC TO 250DEGREESC [J]. THIN SOLID FILMS, 1977, 41 (03) : 341 - 361