VARIABLE-TEMPERATURE SCANNING TUNNELING MICROSCOPE

被引：175

作者：

LYDING, JW ^{[1
]}

SKALA, S ^{[1
]}

HUBACEK, JS ^{[1
]}

BROCKENBROUGH, R ^{[1
]}

GAMMIE, G ^{[1
]}

机构：

[1] UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 09期

关键词：

D O I：

10.1063/1.1140047

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1897 / 1902

页数：6

共 17 条

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[2]

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[4]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[5] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].

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SMITH, DPE .

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[6] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

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ROHRER, H ;

GERBER, C ;

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PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[7] HIGH-STABILITY BIMORPH SCANNING TUNNELING MICROSCOPE [J].

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JERICHO, MH .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) :1343-1348

[8] SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES [J].

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SCHNEIR, J ;

HANSMA, PK .

SURFACE SCIENCE, 1987, 181 (1-2) :92-97

[9] SCANNING TUNNELING MICROSCOPE FOR LOW-TEMPERATURE, HIGH MAGNETIC-FIELD, AND SPATIALLY RESOLVED SPECTROSCOPY [J].

FEIN, AP ;

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FEENSTRA, RM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (10) :1806-1810

[10] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].

GERBER, C ;

BINNIG, G ;

FUCHS, H ;

MARTI, O ;

ROHRER, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224

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