CHARGED STATE CONTROL FOR ORGANIC DOMAIN-STRUCTURE BY ATOMIC-FORCE MICROSCOPE

被引：9

作者：

GEMMA, N

HIEDA, H

TANAKA, K

EGUSA, S

机构：

[1] Toshiba Research and Development Center, Advanced Research Laboratory, Kawasaki, Kanagawa, 210

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1995年 / 34卷 / 7A期

关键词：

AFM; ORGANIC THIN FILMS; CHARGE INJECTION; CONTACT ELECTRIFICATION; DONOR MOLECULES; SURFACE POTENTIAL; CHARGE CONFINEMENTS;

D O I：

10.1143/JJAP.34.L859

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanometer-scale domain structures of organic molecules were fabricated on the SiO2 substrates. The electric charges were injected into the single domain by the contact electrification process using a tip of Atomic Force Microscope. We observed the charge distribution by mapping the surface potential two-dimensionally, and found that the injected charges were stably stored in the isolated domain. The number of injected charges depended on the tip bias during contact, and we succeeded in injecting and imaging only a few elementary charges.

引用

页码：L859 / L862

页数：4

共 19 条

[1] CHARGE STORAGE IN A NITRIDE-OXIDE-SILICON MEDIUM BY SCANNING CAPACITANCE MICROSCOPY [J].