FEMTOSECOND DEPHASING TIMES IN SEMICONDUCTOR MICROCRYSTALS MEASURED WITH INCOHERENT-LIGHT

被引：12

作者：

HUANG, GL ^{[1
]}

KWOK, HS ^{[1
]}

机构：

[1] SUNY BUFFALO,DEPT ELECT & COMP ENGN,BUFFALO,NY 14260

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 1992年 / 9卷 / 11期

关键词：

D O I：

10.1364/JOSAB.9.002019

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Incoherent laser pulses are used to measure the dephasing time of photogenerated excitons in semiconductor-doped glasses. The coherent polarization dephasing time T2 is determined for several commercial glasses as well as for a semiconductor thin film. It is found that T2 varies systematically from less than 5 fs to longer than 70 fs, depending on the degree of excess excitation beyond the band edge. The temperature dependence of T2 is also measured. A systematic behavior of smaller T2 at higher temperature is observed in all samples. These T2 values are believed to result from the loss of orientational coherence of the excitons generated by laser excitation.

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页码：2019 / 2024

页数：6

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