COEXISTENCE OF GRAINS WITH DIFFERING ORTHORHOMBICITY IN HIGH-QUALITY YBA2CU3O7-DELTA THIN-FILMS

被引：5

作者：

DEOBALDIA, EI

LUDWIG, KF

BERKOWITZ, SJ

CLARK, AM

SKOCPOL, WJ

MANKIEWICH, PM

RUDMAN, DA

ROSHKO, A

MOERMAN, R

VALE, L

ONO, RH

机构：

[1] BOSTON UNIV, BOSTON, MA 02215 USA

[2] NATL INST STAND & TECHNOL, BOULDER, CO 80303 USA

来源：

APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 26期

关键词：

D O I：

10.1063/1.112402

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High quality films of YBa2Cu3O7-δ on LaAlO3 have been grown by pulsed-laser deposition at oxygen pressures of 3.4-54 Pa (25-400 mTorr). X-ray diffraction reveals the coexistence of grains that align with the substrate axes (axial grains) and grains that are rotated by 0.4°from the substrate axes (diagonal grains). The axial grains are tetragonal while the diagonal grains achieve lattice parameters close to bulk YBa2Cu3O7. The relative proportion of axial grains accounts for the measured variations of normal-state conductance and superconducting critical current density from film to film, based on a simple two-dimensional model of randomly positioned, insulating axial grains. © 1994 American Institute of Physics.

引用

页码：3395 / 3397

页数：3

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