X-RAY-DIFFRACTION MAPPING OF EPITAXIAL YBA2CU3O7-X THIN-FILMS - DETERMINATION OF INPLANE EPITAXY AND A-AXIS, B-AXIS, AND C-AXIS LENGTHS IN FILMS WITH VARYING OXYGEN DEFICIENCY

被引:16
作者
HAN, ZH
HELMERSSON, U
SELINDER, TI
SUNDGREN, JE
机构
[1] Thin Film Physics Division, Department of Physics, Linkoping University
来源
PHYSICAL REVIEW B | 1993年 / 47卷 / 06期
关键词
D O I
10.1103/PhysRevB.47.3431
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial YBa2Cu3O7-x thin films with varying oxygen content have been studied by x-ray-diffraction (XRD) mapping. Results show that the films have a high epitaxial quality with the a and b axes aligned in the [100] or [010] directions of the (001) LaAlO3 substrate. The two twin domains in the orthorhombic films are present in equal amounts, both for the as-deposited and the oxygen-deficient films. From XRD maps of the (00l), (308), and (038) peaks, the a-, b-, and c-axis lengths were measured as a function of superconducting transition temperature T(c). The results show that the unit-cell variation for relaxed epitaxial films agrees with that of bulk material.
引用
收藏
页码:3431 / 3434
页数:4
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