XPS STUDY OF ALPHA-QUARTZ SURFACE

被引：47

作者：

GORLICH, E ^{[1
]}

HABER, J ^{[1
]}

STOCH, A ^{[1
]}

STOCH, J ^{[1
]}

机构：

[1] STANISLAS STASZIC ACAD MIN & MET,INST MAT SCI,PL-30059 CRACOW,POLAND

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 1980年 / 33卷 / 01期

关键词：

D O I：

10.1016/0022-4596(80)90555-1

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

引用

页码：121 / 124

页数：4

共 18 条

[1]

[Anonymous], 1961, DISCUSS FARADAY SOC, DOI DOI 10.1039/DF9613100203

[2] THEORETICAL MODELS FOR INTERPRETATION OF ESCA SPECTRA [J].

BASCH, H .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :463-500

[3]

BELL T, 1962, PHYS CHEM GLASSES-B, V3, P141

[4] X-RAY PHOTOELECTRON STUDY OF SOME SILICON-OXYGEN COMPOUNDS [J].

CARRIERE, B ;

DEVILLE, JP ;

BRION, D ;

ESCARD, J .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 10 (02) :85-91

[5]

ESCARD J, 1973, CR ACAD SCI B PHYS, V277, P519

[6]

FOMENKO VS, 1970, EMISSON PROPERTIES M

[7] INFRARED STUDIES OF VITREOUS SILICA AT ELEVATED-TEMPERATURES [J].

GORLICH, E ;

BLASZCZAK, K ;

SIEMINSKA, G .

JOURNAL OF MATERIALS SCIENCE, 1974, 9 (12) :1926-1932

[8]

HETHERINGTON G, 1964, PHYS CHEM GLASSES-B, V5, P147

[9] CHEMICAL BOND AND RELATED PROPERTIES OF SIO2 .3. CORE-LEVEL SHIFTS IN SIOX [J].

HUBNER, K .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 42 (02) :501-509

[10]

KOCHSTRASSE G, 1966, HELV PHYS ACTA, V39, P189

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