MICROSTRUCTURAL CHARACTERIZATION OF YBA2CU3O7-DELTA THIN-FILMS ON SRTIO3 USING 4-AXIS X-RAY-DIFFRACTION

被引：12

作者：

SIZEMORE, J ^{[1
]}

BARTON, R ^{[1
]}

MARSHALL, A ^{[1
]}

BRAVMAN, JC ^{[1
]}

NAITO, M ^{[1
]}

CHAR, K ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 02期

关键词：

D O I：

10.1109/20.92850

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2245 / 2249

页数：5

共 20 条

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[2] BARRETT C, 1980, STRUCTURE METALS, P177
[3] STRUCTURE OF THE SINGLE-PHASE HIGH-TEMPERATURE SUPERCONDUCTOR YBA2CU3O7-DELTA
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[J]. APPLIED PHYSICS LETTERS, 1987, 51 (01) : 57 - 59
[4] CRYSTALLOGRAPHY AND MICROSTRUCTURE OF Y1BA2CU3O9-X, A PEROVSKITE-BASED SUPERCONDUCTING OXIDE
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[J]. APPLIED PHYSICS LETTERS, 1987, 50 (26) : 1918 - 1920
[5] OPTICAL MEASUREMENTS ON ORIENTED THIN YBA2CU3O7-DELTA FILMS - LACK OF EVIDENCE FOR EXCITONIC SUPERCONDUCTIVITY
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[J]. PHYSICAL REVIEW LETTERS, 1987, 59 (19) : 2219 - 2221
[6] BOZOVIC I, 1988, IN PRESS PHYS REV B, V38
[7] MILLIMETER-WAVE SURFACE-RESISTANCE MEASUREMENTS IN HIGHLY ORIENTED YBA2CU3O7-DELTA THIN-FILMS
CARINI, JP
AWASTHI, AM
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KAPITULNIK, A
[J]. PHYSICAL REVIEW B, 1988, 37 (16): : 9726 - 9729
[8] PROPERTIES OF Y-BA-CU-O THIN-FILMS WITH ORDERED DEFECT STRUCTURE - Y2BA4CU8O20-X
CHAR, K
LEE, M
BARTON, RW
MARSHALL, AF
BOZOVIC, I
HAMMOND, RH
BEASLEY, MR
GEBALLE, TH
KAPITULNIK, A
LADERMAN, SS
[J]. PHYSICAL REVIEW B, 1988, 38 (01): : 834 - 837
[9] REACTIVE MAGNETRON SPUTTERING OF THIN-FILM SUPERCONDUCTOR YBA2CU3O7-CHI
CHAR, K
KENT, AD
KAPITULNIK, A
BEASLEY, MR
GEBALLE, TH
[J]. APPLIED PHYSICS LETTERS, 1987, 51 (17) : 1370 - 1372
[10] CRITICAL-CURRENT MEASUREMENTS IN EPITAXIAL-FILMS OF YBA2CU3O7-X COMPOUND
CHAUDHARI, P
KOCH, RH
LAIBOWITZ, RB
MCGUIRE, TR
GAMBINO, RJ
[J]. PHYSICAL REVIEW LETTERS, 1987, 58 (25) : 2684 - 2686

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