ELECTROCHEMISTRY OF SINGLE-CRYSTAL SURFACES

[1] BAKER AD, 1978, ANAL CHEM, V50, pR328, DOI 10.1021/ac50028a030

[2] BAKER BG, 1975, MOD ASPECT ELECTROC, V10, P93

[3] BARD AJ, ELECTROANALYTICAL CH

[4] BARD AJ, ENCYCLOPEDIA ELECTRO

[5] BAUER E, 1969, TECHNIQUES METALS 2, V2, P559

[6] Bauer HH, 1972, ELECTRODICS

[7] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[8] Bockris JOM, MODERN ASPECTS ELECT

[9] BOOMAN GL, 1965, ANAL CHEM, V37, P1768

[10] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +

[1] BAKER AD, 1978, ANAL CHEM, V50, pR328, DOI 10.1021/ac50028a030

[2] BAKER BG, 1975, MOD ASPECT ELECTROC, V10, P93

[3] BARD AJ, ELECTROANALYTICAL CH

[4] BARD AJ, ENCYCLOPEDIA ELECTRO

[5] BAUER E, 1969, TECHNIQUES METALS 2, V2, P559

[6] Bauer HH, 1972, ELECTRODICS

[7] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[8] Bockris JOM, MODERN ASPECTS ELECT

[9] BOOMAN GL, 1965, ANAL CHEM, V37, P1768

[10] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +