LOW-TEMPERATURE CMOS - A BRIEF REVIEW

被引:61
作者
CLARK, WF [1 ]
ELKAREH, B [1 ]
PIRES, RG [1 ]
TITCOMB, SL [1 ]
ANDERSON, RL [1 ]
机构
[1] UNIV VERMONT,CRYOELECTR LAB,BURLINGTON,VT 05405
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1992年 / 15卷 / 03期
关键词
D O I
10.1109/33.148509
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Device improvements obtained from exploiting the dependence of physical characteristics of silicon at low temperature are above and beyond those improvements obtained from the usual geometric scaling of device dimensions. As device geometries continue to shrink into the deep submicrometer regime, second-order effects begin to limit further increases in device speed from scaling alone. Temperature scaling provides an additional variable for system optimization. The gain in performance at cryogenic temperatures, however, is at the expense of inconvenience and additional cost for system refrigeration, and or increased susceptibility to hot carrier degradation. Optimizing CMOS technology and design for low temperature applications can increase performance and reduce power dissipation without increasing hot carrier degradation.
引用
收藏
页码:397 / 404
页数:8
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