SWITCHING CHARACTERISTICS OF SCALED CMOS CIRCUITS AT 77-K

被引：19

作者：

HUANG, JST ^{[1
]}

SCHRANKLER, JW ^{[1
]}

机构：

[1] HONEYWELL INC, DIV SOLID STATE ELECTR, PLYMOUTH, MN 55441 USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 01期

关键词：

D O I：

10.1109/T-ED.1987.22891

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：101 / 106

页数：6

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