学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
UNIFIED FIELD-EFFECT TRANSISTOR-THEORY INCLUDING VELOCITY SATURATION
被引:20
作者
:
MURPHY, BT
论文数:
0
引用数:
0
h-index:
0
MURPHY, BT
机构
:
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1980年
/ 15卷
/ 03期
关键词
:
D O I
:
10.1109/JSSC.1980.1051393
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:325 / 328
页数:4
相关论文
共 11 条
[1]
CHARACTERISTICS OF JUNCTION-GATE FIELD EFFECT TRANSISTOR WITH SHORT CHANNEL LENGTH
CHIU, TL
论文数:
0
引用数:
0
h-index:
0
CHIU, TL
GHOSH, HN
论文数:
0
引用数:
0
h-index:
0
GHOSH, HN
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(12)
: 1307
-
&
[2]
DANG LM, 1979, IEEE T ELECTRON DEV, V26, P436
[3]
1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
DENNARD, RH
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
GAENSSLEN, FH
WALKER, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
WALKER, EJ
COOK, PW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
COOK, PW
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
: 247
-
255
[4]
FOSS RC, 1979, 5TH DIG EUR SOL STAT, P18
[5]
MODEL AND PERFORMANCE OF HOT-ELECTRON MOS-TRANSISTORS FOR VLSI
HOEFFLINGER, B
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
HOEFFLINGER, B
SIBBERT, H
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
SIBBERT, H
ZIMMER, G
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
ZIMMER, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 513
-
520
[6]
CARRIER MOBILITY AND CURRENT SATURATION IN MOS TRANSISTOR
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(03)
: 129
-
+
[7]
CURRENT SATURATION AND SMALL-SIGNAL CHARACTERISTICS OF GAAS FIELD-EFFECT TRANSISTORS
HOWER, PL
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES & DEV CTR,PITTSBURGH,PA 15235
HOWER, PL
BECHTEL, NG
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES & DEV CTR,PITTSBURGH,PA 15235
BECHTEL, NG
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(03)
: 213
-
220
[8]
KLASSEN FM, 1977, PROCESS DESIGN MODEL
[9]
VOLGATE-CURRENT CHARACTERISTICS OF GAAS J-FETS IN HOT ELECTRON RANGE
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
ZULEEG, R
论文数:
0
引用数:
0
h-index:
0
ZULEEG, R
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(10)
: 1415
-
&
[10]
ACCURATE LARGE-SIGNAL MOS TRANSISTOR MODEL FOR USE IN COMPUTER-AIDED DESIGN
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
BOREL, J
论文数:
0
引用数:
0
h-index:
0
BOREL, J
CUPCEA, NZ
论文数:
0
引用数:
0
h-index:
0
CUPCEA, NZ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
: 681
-
+
←
1
2
→
共 11 条
[1]
CHARACTERISTICS OF JUNCTION-GATE FIELD EFFECT TRANSISTOR WITH SHORT CHANNEL LENGTH
CHIU, TL
论文数:
0
引用数:
0
h-index:
0
CHIU, TL
GHOSH, HN
论文数:
0
引用数:
0
h-index:
0
GHOSH, HN
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(12)
: 1307
-
&
[2]
DANG LM, 1979, IEEE T ELECTRON DEV, V26, P436
[3]
1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
DENNARD, RH
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
GAENSSLEN, FH
WALKER, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
WALKER, EJ
COOK, PW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
COOK, PW
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
: 247
-
255
[4]
FOSS RC, 1979, 5TH DIG EUR SOL STAT, P18
[5]
MODEL AND PERFORMANCE OF HOT-ELECTRON MOS-TRANSISTORS FOR VLSI
HOEFFLINGER, B
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
HOEFFLINGER, B
SIBBERT, H
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
SIBBERT, H
ZIMMER, G
论文数:
0
引用数:
0
h-index:
0
机构:
University of Dortmund, Dortmund
ZIMMER, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 513
-
520
[6]
CARRIER MOBILITY AND CURRENT SATURATION IN MOS TRANSISTOR
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(03)
: 129
-
+
[7]
CURRENT SATURATION AND SMALL-SIGNAL CHARACTERISTICS OF GAAS FIELD-EFFECT TRANSISTORS
HOWER, PL
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES & DEV CTR,PITTSBURGH,PA 15235
HOWER, PL
BECHTEL, NG
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES & DEV CTR,PITTSBURGH,PA 15235
BECHTEL, NG
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(03)
: 213
-
220
[8]
KLASSEN FM, 1977, PROCESS DESIGN MODEL
[9]
VOLGATE-CURRENT CHARACTERISTICS OF GAAS J-FETS IN HOT ELECTRON RANGE
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
ZULEEG, R
论文数:
0
引用数:
0
h-index:
0
ZULEEG, R
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(10)
: 1415
-
&
[10]
ACCURATE LARGE-SIGNAL MOS TRANSISTOR MODEL FOR USE IN COMPUTER-AIDED DESIGN
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
BOREL, J
论文数:
0
引用数:
0
h-index:
0
BOREL, J
CUPCEA, NZ
论文数:
0
引用数:
0
h-index:
0
CUPCEA, NZ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
: 681
-
+
←
1
2
→