COHERENCY STRAIN-ENERGY AND THERMAL STRAIN-ENERGY OF THIN-FILMS IN ANY CRYSTAL SYSTEM

被引：12

作者：

HAY, RS

机构：

[1] Wright Materials Laboratory Wpafb

来源：

SCRIPTA METALLURGICA ET MATERIALIA | 1992年 / 26卷 / 04期

关键词：

D O I：

10.1016/0956-716X(92)90279-N

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：535 / 540

页数：6

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