IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN

[1] BATES DR, 1962, ATOMIC MOL PROCESSES, P245

[2] Conwell E M, 1967, HIGH FIELD TRANSPORT

[3] BND EDGE OF AMORPHOUS SIO2 BY PHOTOINJECTION AND PHOTOCONDUCTIVITY MEASUREMENTS [J]. SOLID STATE COMMUNICATIONS, 1971, 9 (24) : 2259 - +

[4] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2 [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (23) : 1560 - +

[5] THICKNESS INFLUENCE IN BREAKDOWN PHENOMENA OF THIN DIELECTRIC FILMS [J]. PHYSICA STATUS SOLIDI, 1964, 4 (02): : 311 - 324

[6] ON THE THEORY OF DIELECTRIC BREAKDOWN IN SOLIDS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1947, 188 (1015): : 521 - 532

[7] Theory of electrical breakdown in ionic crystals [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1937, 160 (A901) : 0230 - 0241

[8] FROHLICH H, 1942, P R SOC, V178, P493

[9] HIPPEL A, 1949, PHYS REV, V76, P127

[10] HIPPEL ARV, 1937, J APPL PHYS, V8, P815

[1] BATES DR, 1962, ATOMIC MOL PROCESSES, P245

[2] Conwell E M, 1967, HIGH FIELD TRANSPORT

[3] BND EDGE OF AMORPHOUS SIO2 BY PHOTOINJECTION AND PHOTOCONDUCTIVITY MEASUREMENTS [J]. SOLID STATE COMMUNICATIONS, 1971, 9 (24) : 2259 - +

[4] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2 [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (23) : 1560 - +

[5] THICKNESS INFLUENCE IN BREAKDOWN PHENOMENA OF THIN DIELECTRIC FILMS [J]. PHYSICA STATUS SOLIDI, 1964, 4 (02): : 311 - 324

[6] ON THE THEORY OF DIELECTRIC BREAKDOWN IN SOLIDS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1947, 188 (1015): : 521 - 532

[7] Theory of electrical breakdown in ionic crystals [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1937, 160 (A901) : 0230 - 0241

[8] FROHLICH H, 1942, P R SOC, V178, P493

[9] HIPPEL A, 1949, PHYS REV, V76, P127

[10] HIPPEL ARV, 1937, J APPL PHYS, V8, P815