HIGH-RESOLUTION THERMIONIC CATHODE SCANNING TRANSMISSION ELECTRON-MICROSCOPE

被引：34

作者：

BROERS, AN ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1063/1.1654527

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：610 / 612

页数：3

共 8 条

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[4] A SCANNING MICROSCOPE WITH 5 A RESOLUTION
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[5] ELECTRON GUN USING A FIELD EMISSION SOURCE
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EGGENBER.DN
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[6] Oatley C.W., 1966, ADV ELECTRON, V21, P181, DOI DOI 10.1016/S0065-2539(08)61010-0
[7] ZEITLER E, 1970, OPTIK, V31, P359
[8] ZEITLER E, 1970, OPTIK, V31, P258