CONTROLLED JET POLISHING OF SPECIMENS FOR TRANSMISSION ELECTRON MICROSCOPY

被引:20
作者
DUBOSE, CKH
STIEGLER, JO
机构
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D O I
10.1063/1.1720806
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:694 / &
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