SOME ASPECTS OF SCANNING ELECTRON MICROSCOPY

被引：7

作者：

KAMMLOTT, GW

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(71)90212-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：120 / +

页数：1

共 24 条

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[4]

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[5]

Busch H, 1926, ANN PHYS-BERLIN, V81, P974

[6] HIGH-VOLTAGE TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].

COWLEY, JM .

[7] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J].

CREWE, AV ;

WALL, J ;

WELTER, LM .

[8]

Evekhart T.E., 1959, J ELECT CONTROL, V7, P97, DOI 10.1080/00207215908937191

EVERHART, TE ;

THORNLEY, RFM .

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[10]

Hachenberg O., 1959, ADVAN ELECTRON ELECT, V11, P413