HIGH-VOLTAGE TRANSMISSION SCANNING ELECTRON MICROSCOPY

[1] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1185 - &

[2] ELECTRONIC MEASUREMENT OF ELECTRON MICROSCOPE INTENSITIES AND ENERGIES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 254 - &

[3] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1179 - &

[4] COCKAYNE DJH, 1967, REV SCI INSTRUMENTS, V38, P1093

[5] COSSLETT VE, 1968, 4 P EUR REG C EL MIC, P59

[6] IRRADIATION EFFECTS IN BERYLLIA AND ZINC OXIDE [J]. ACTA CRYSTALLOGRAPHICA, 1966, 21 : 192 - &

[7] DETERMINATION OF STRUCTURE FACTORS FROM DYNAMICAL EFFECTS IN ELECTRON DIFFRACTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 129 - &

[8] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[9] CREWE AV, 1969, 2 ANN SCANN EL MICR

[10] CREWE AV, 1966, SCIENTIFIC RESEARCH, V1, P31

[1] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1185 - &

[2] ELECTRONIC MEASUREMENT OF ELECTRON MICROSCOPE INTENSITIES AND ENERGIES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 254 - &

[3] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1179 - &

[4] COCKAYNE DJH, 1967, REV SCI INSTRUMENTS, V38, P1093

[5] COSSLETT VE, 1968, 4 P EUR REG C EL MIC, P59

[6] IRRADIATION EFFECTS IN BERYLLIA AND ZINC OXIDE [J]. ACTA CRYSTALLOGRAPHICA, 1966, 21 : 192 - &

[7] DETERMINATION OF STRUCTURE FACTORS FROM DYNAMICAL EFFECTS IN ELECTRON DIFFRACTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 129 - &

[8] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[9] CREWE AV, 1969, 2 ANN SCANN EL MICR

[10] CREWE AV, 1966, SCIENTIFIC RESEARCH, V1, P31