LOW-TEMPERATURE ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE

被引:19
作者
LANG, CA
DOVEK, MM
QUATE, CF
机构
关键词
D O I
10.1063/1.1140586
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:3109 / 3112
页数:4
相关论文
共 13 条
[1]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689
[2]   IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J].
BRYANT, A ;
SMITH, DPE ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1986, 48 (13) :832-834
[3]   DESIGN OF A SCANNING TUNNELING MICROSCOPE FOR ELECTROCHEMICAL APPLICATIONS [J].
DOVEK, MM ;
HEBEN, MJ ;
LANG, CA ;
LEWIS, NS ;
QUATE, CF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (11) :2333-2336
[4]   CHARACTERIZATION OF GOLD SURFACES FOR USE AS SUBSTRATES IN SCANNING TUNNELING MICROSCOPY STUDIES [J].
EMCH, R ;
NOGAMI, J ;
DOVEK, MM ;
LANG, CA ;
QUATE, CF .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :79-84
[5]   ATOM-SELECTIVE IMAGING OF THE GAAS(110) SURFACE [J].
FEENSTRA, RM ;
STROSCIO, JA ;
TERSOFF, J ;
FEIN, AP .
PHYSICAL REVIEW LETTERS, 1987, 58 (12) :1192-1195
[6]   TUNNELING SPECTROSCOPY OF THE GAAS(110) SURFACE [J].
FEENSTRA, RM ;
STROSCIO, JA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04) :923-929
[7]   OBSERVATION OF ATOMIC CORRUGATION ON AU(111) BY SCANNING TUNNELING MICROSCOPY [J].
HALLMARK, VM ;
CHIANG, S ;
RABOLT, JF ;
SWALEN, JD ;
WILSON, RJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (25) :2879-2882
[8]   SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975
[9]   EXPOSURE OF CALCIUM-FLUORIDE RESIST WITH THE SCANNING TUNNELING MICROSCOPE [J].
MCCORD, MA ;
PEASE, RFW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01) :430-433
[10]   CHEMICAL-DEPENDENCE OF THE MULTIPLE-TIP EFFECT IN SCANNING TUNNELING MICROSCOPY [J].
PARK, SI ;
NOGAMI, J ;
MIZES, HA ;
QUATE, CF .
PHYSICAL REVIEW B, 1988, 38 (06) :4269-4272