MULTISIGNAL FLOW-GRAPHS - A NOVEL-APPROACH FOR SYSTEM TESTABILITY ANALYSIS AND FAULT-DIAGNOSIS

被引：105

作者：

DEB, S

PATTIPATI, KR

RAGHAVAN, V

SHAKERI, M

SHRESTHA, R

机构：

[1] Department of Electrical and Systems Engineering, University of Connecticut, Storrs, CT 06269-3157

来源：

IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE | 1995年 / 10卷 / 05期

关键词：

D O I：

10.1109/62.373993

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

In this paper, we present a comprehensive methodology for a formal,but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.

引用

页码：14 / 25

页数：12