A NEW METHOD FOR OPTIMAL-RESOLUTION ELECTRON-MICROSCOPY OF RADIATION-SENSITIVE SPECIMENS

被引：90

作者：

FUJIYOSHI, Y

KOBAYASHI, T

ISHIZUKA, K

UYEDA, N

ISHIDA, Y

HARADA, Y

机构：

来源：

关键词：

D O I：

10.1016/S0304-3991(80)80004-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：459 / 468

页数：10

共 11 条

[1] ADACHI K, 1968, Journal of Electron Microscopy, V17, P280
[2] MOLECULAR IMAGES OF HYDROCARBON C22H12-ANTHANTHRENE
FRYER, JR
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JUL): : 603 - 607
[3] HARADA Y, 1979, J ELECTRON MICROSC, V28, P227
[4] HERRMANN KH, 1976, 6TH P EUR C EL MICR, P342
[5] MINIMAL BEAM EXPOSURE WITH A FIELD-EMISSION SOURCE
OHTSUKI, M
ZEITLER, E
[J]. ULTRAMICROSCOPY, 1975, 1 (02) : 163 - 165
[6] UNWIN PNT, 1975, J MOL BIOL, V94, P525
[7] CRYSTAL-STRUCTURE OF AG-TCNQ
UYEDA, N
KOBAYASHI, T
ISHIZUKA, K
FUJIYOSHI, Y
[J]. NATURE, 1980, 285 (5760) : 95 - 97
[8] UYEDA N, 1978, CHEM SCRIPTA, V14, P47
[9] UYEDA N, 1970, MICROSC ELECTRON, V1, P443
[10] WADE RH, 1977, OPTIK, V49, P81